SC-1 HP: High-pressure x-ray Crystallography
Synchrotron-Level Investigation of Materials at High Pressure
- Innovative 15-micron x-ray beam
- High-brightness MetalJet x-ray source
- Highly penetrating indium x-ray beam for low signal loss through diamond anvil cells (DACs)
- Compatible with DACs up to 200 GPa
- Choice of best-in-class area detectors, optics, and coolers
- Industry-leading detector technology for the best possible dynamic range with zero background
- Suitable for both single-crystal and powder x-ray diffraction
Bright X-ray Source
The MetalJet E1+ with liquid indium anode provides unmatched x-ray flux and excellent penetration of diamond anvils.
Unbeatable X-ray Detection
Direct capturing of x-ray photons, zero noise, unparalleled dynamic range, and the ultimate signal to noise. CdTe sensors provide the highest quantum efficiency on the market for indium.
Customization
- Optic customization: beam sizes from 15–90 microns
- Variable divergence from 2–9 milliradians
- Sample stage can be designed to accommodate various cryostats
- Standard or custom mounts
