XRDWIN® 2.0 SOFTWARE

Our Powerful X-ray Diffraction Software Packages for Stress, Laue, and Powder Diffraction

XRDWIN 2.0 is an extremely powerful yet easy-to-operate x-ray diffraction software package for our lines of XRD instruments. Whether you’re using one of our residual stress systems, Laue orientation systems, or powder diffractometers, you can rely on our dedicated software packages to enhance the capabilities of your system.

XRDWInd 2.0 software screen

RESIDUAL STRESS MEASUREMENT

XRDWIN 2.0 Software

XRDWIN 2.0 is a comprehensive and convenient software package for our line of XRD instruments. Our package is your one-stop solution for residual stress measurement, retained austenite measurement, pole figures, x-ray elastic constant (XEC) determination, and much more.

FEATURES

TRIAXIAL STRESS MEASUREMENT

RESIDUAL STRESS MAPPING

As the originators of automated stress mapping, we have spent considerable time developing a comprehensive set of patented stress mapping techniques and software tools.

Features include square, rectangular, and circle grid mapping; individual point selection for custom map trajectories; and patented multi-level 3D graphical representation of results. There is also a multi-map display and map algebra capability.

Mix and Match Maps
Residual stress • Peak width • % Retained austenite • Hardness • Principal stress • Individual stress tensors

Show Before and After Maps
Compare pre- and post-process • Compare new and used • Track life cycle

Perform Map Algebra
+, -, x, /, average •  Show net gains/losses

Validate Your Data
Verify FEA models • Evaluate surface enhancements • Determine weld stresses

Residual stress mapping results
Residual stress mapping resultsResidual stress mapping results

UTILITIES

  • Principal stress calculator
  • Material removal correction
  • Effective depth of x-ray penetration correction
  • X-ray elastic constant (XEC) determination
  • Remote access through network
Residual stress utilities screenResidual stress utilities screen

ADD-IN MODULES

  • Pole figure module
  • Expert system module
  • Database management module
  • Inline inspection stress monitor
  • Proto strain gage monitor module
  • Four-peak retained austenite measurement module
Add-in modules
XRDwin laue

LAUE SINGLE-CRYSTAL ORIENTATION

XRDWIN 2.0 Laue

This specialized version of XRDWIN is designed for both operation of our single-crystal Laue orientation systems and data analysis of Laue patterns. Standard features include a comprehensive set of tools for analyzing patterns, indexing, and reorienting crystals. High-speed production mode simplifies high-throughput orientation of single-crystal components such as turbine blades.

STANDARD FEATURES

  • Laue pattern simulation from space group and crystal data
  • Automated indexing of patterns
  • Orientation matrix will suggest necessary movements of crystal to correct orientation
  • Live-image mode for real-time viewing of Laue patterns
  • Ability to control image collection time and number of frames
  • Ability to save Laue images

PRODUCTION MODE FEATURES

  • 001, 011, and 111 overlays for manual matching of Laue patterns
  • Editable custom hkl overlays
  • Space mouse for easy rotation of overlay
  • USA angles: gamma, delta, alpha, beta, R-value
  • US convention 1 and 2
  • UK angles: gamma, delta, theta, alpha, R-values, kappa, rho, omega
  • R-value calculations available using REL cos (R-2cos), REL rms (R-2RMS), DIFF cos (R-3cos), DIFF rms (R-3RMS), and single-angle cos (R-1cos)
  • Off-orientation mode with both nearest 001 reference option and a local reference option
  • Automated indexing and computerized matching of any Laue pattern
  • Option to customize production interface as per your requirement
  • Option to interface results to company database for storage and verification

POWDER DIFFRACTION

XRDWIN PD

This specialized version of XRDWIN is designed for both operation of our powder diffractometers and data analysis of powder patterns. Choose XRDWIN PD for basic qualitative and quantitative analysis.

XRDWin PD

XRDWIN PD FEATURES

  • Instrument warm-up and control, data collection
  • 1 and Kα2 separation
  • Data smoothing
  • Integrated intensity
  • Background fitting
  • Peak search and fitting
  • Intensity-ratio method for quantitative analysis
  • Spike method for quantitative analysis
  • Crystallite size
  • ICDD database search-match (database extra)
  • MDI JADE interface (JADE extra)

JADE FEATURES

For advanced analysis of your diffraction patterns, we offer MDI's JADE 2010 software. This program integrates with XRDWIN PD to provide seamless access to advanced analysis tools such as Rietveld refinement.

  • One-click analysis
  • Clay d-space cursor
  • Whole-pattern fitting
  • Rietveld analysis
  • Constrained bond distance in Rietveld
  • Intelligent XRD input tool
  • Cluster analysis
  • Compare before/after shift limits
  • Dynamic 3D atom shifts while refining lattice constants
  • Uses shift limits on lattice constants and profile broadening
  • Quantitative report for batch processing
  • Refined phases summary
  • Ability to select regions for exclusion
  • Quantitative report for batch processing
  • Constraint models profiles
  • Intelligent constraints on atomic coordinates
  • Polynomial/user background models
  • Auto-refine multiple observed patterns
  • Lattice constant determination
  • Smart auto-load of available structures
  • Real-time display of refinements
  • Structure/structureless phase data
  • Quantitative analysis
  • Spiking calibration plots and curves
  • 2D/3D pie and bar charts and presentation reports
  • Amorphous content determination with standards
  • Preferred-orientation models
  • Brindley absorption correction
  • ICDD PDF overlays integrated for reference d-lists
  • Peak selection by user for multi-phase analysis
  • Line profile-based RIR analysis with statistics
  • Qualitative analysis
  • “Déjà vu” search/match
  • Automatic phase learning
  • Isotypical pattern finder
  • Factor analysis of search/match hits
  • Extensive search/match filters
  • Preferred-orientation search/match
  • Solid solution search/match
Jade software
  • Major/minor/trace phase search/match
  • Whole-pattern search
  • Create reference pattern databases
  • Cell refinement with statistics
  • Retrieval of structures from all databases
  • Support for NIST crystal data
  • Create powder diffraction databases
  • Read and write IUCr CIF files
  • Residual stress analysis of ψ–scan data
  • Pattern indexing with space group constraints
  • Compare crystal structures in 3D
  • Full physics simulation
  • MDI Minerals Database included
  • 3D multiple-pattern views
  • Reads all major formats
  • Theta calibration
  • Profile fitting
  • Crystallite size estimates
  • Background and Kα2 removal
  • Sophisticated data smoothing
  • Overlay multiple patterns
  • Pattern editing
  • Automatic peak finding