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LAUE SINGLE CRYSTAL ORIENTATION

XRDWIN 2.0 Laue

This specialized version of XRDWIN is designed for both operating our single crystal Laue orientation systems and data analysis of  Laue patterns. Standard features include a comprehensive set of tools for analyzing patterns, indexing and reorienting crystals. A high-speed production mode simplifies high-throughput orientation of single crystal components such as turbine blades.

STANDARD FEATURES

• Laue pattern simulation from space group and crystal data.

• Automated indexing of patterns.

• Orientation matrix will suggest necessary movements of crystal to correct orientation.

• Live Image mode for real-time viewing of Laue patterns.

• Fully editable image time and frames.

• Ability to save Laue images.

 

PRODUCTION MODE FEATURES

• 001, 011 & 111 overlays for manual matching of Laue patterns.

• Editable custom hkl overlays.

• Space mouse control for rotation of overlay.

• USA angles: gamma, delta, alpha, beta, R-value

• US convention 1 and 2

• UK angles: gamma, delta, theta, alpha, R-values, kappa, rho, omega

• R –value calculations available using: REL cos (R-2cos), REL rms (R-2RMS), DIFF cos (R-3cos), DIFF rms (R-3RMS), Single-angle cos (R-1cos)

• Off orientation mode with both nearest 001 reference option and a local reference option.

• Automated indexing and computerized matching of any Laue pattern.

• Option to customize production collection screens as per your requirement.

• Option to interface results to company database for storage and verification.